JEOL: Release of a New Schottky Field Emission(FE) Scanning Electron Microscope JSM-F100

JSM-F100

TOKYO--(BUSINESS WIRE)--Aug 4, 2019--

JEOL Ltd. (TOKYO:6951) ( www.jeol.com ) (President & COO Izumi Oi) announces the release of a new Schottky field emission scanning electron microscope, JSM-F100 in August 2019.

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JSM-F100 (Photo: Business Wire)

Background

Scanning electron microscopes(SEMs) are used in various fields; nanotechnology, metals, semiconductors, ceramics, medicine, and biology. With application expansion, SEM users are in need of fast high-quality data acquisition and simple compositional information confirmation with seamless operation.

The JSM-F100 incorporates our highly regarded In-lens Schottky Plus FE electron gun and "Neo Engine"(electron optical control system) as well as a new GUI "SEM Center" and an innovative "LIVE-AI(Live Image Visual Enhancer-Artificial Intelligence) filter". This enables an optimal combination of high-spatial-resolution imaging and operability. Furthermore, a standard JEOL energy dispersive X-ray spectrometer(EDS) is fully integrated within "SEM Center" for seamless acquisition from images to elemental analysis results. The JSM-F100 achieves superb work efficiency, 50% or higher than that of our previous JSM-7000 series, realizing dramatically-increased high throughput.

Features

  1. In-lens Schottky Plus FE electron gun
    Enhanced integration of the electron gun and low-aberration condenser lens provides higher brightness. Ample probe current at low accelerating voltage supports various capabilities from high-resolution imaging to high-speed elemental mapping.
  2. Hybrid Lens(HL)
    The Hybrid Lens(HL), combining the electrostatic and magnetic field lens, supports high-spatial-resolution imaging and analysis of various specimens.
  3. Neo Engine(New Electron Optical Engine)
    Neo Engine, a cutting-edge electron optical control system, significantly improves the precision of automatic functions and operability.
  4. New function of "SEM Center"
    A new operation GUI "SEM Center" fully integrates SEM imaging and EDS analysis and provides next-generation operability and high-resolution images obtained with FE-SEM.
  5. New "Zeromag" function
    "Zeromag", incorporated for seamless transition from optical to SEM imaging, makes it easy to locate the target specimen area.
  6. New LIVE-AI filter*
    Utilizing the AI(artificial intelligence) capability, LIVE-AI filter is incorporated for a higher quality of live images. Unlike image integration processing, this new filter displays a seamless moving live image with no residual image and is very effective for quickly searching observation areas, focusing, and stigmator adjustment.
    *optional

Specifications

Resolution(1 kV)

1.3 nm

Resolution(20 kV)

0.9 nm

Accelerating voltage

0.01 to 30 kV

Standard detectors

Upper Electron Detector(UED), Secondary Electron Detector(SED)

Electron gun

In-lens Schottky Plus FE electron gun

Probe current

A few pA to 300 nA(30 kV)
A few pA to 100 nA(5 kV)

Objective lens

Hybrid Lens(HL)

Specimen stage

Full eucentric goniometer stage

Specimen movement

X: 70 mm, Y: 50 mm, Z: 2 to 41 mm
Tilt: –5 to 70°, Rotation: 360°

EDS detector

Energy resolution: 133 eV or less
Detectable elements: B(boron) to U(uranium)
Detection area: 60 mm 2

Annual unit sales target

60 units/year

JEOL Ltd.

3-1-2, Musashino, Akishima, Tokyo, 196-8558, Japan

Izumi Oi, President & COO

(Stock code:6951, Tokyo Stock Exchange First Section)

CONTACT: JEOL Ltd.

Science and Measurement Instruments Sales Division

Kazunori Kitazumi

+81-3-6262-3567

https://www.jeol.co.jp/en/support/support—system/contact—products.html

KEYWORD: JAPAN ASIA PACIFIC

INDUSTRY KEYWORD: RESEARCH HARDWARE TECHNOLOGY OTHER MANUFACTURING SCIENCE NANOTECHNOLOGY OTHER TECHNOLOGY OTHER SCIENCE MANUFACTURING

SOURCE: JEOL Ltd.

Copyright Business Wire 2019.

PUB: 08/04/2019 04:00 AM/DISC: 08/04/2019 04:00 AM

Copyright Business Wire 2019.